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Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications


Peter Bradley, Anatoly B. Rosenfeld, K.K. Lee, D.N. Jamieson, Gernot Heiser and S. Satoh

    School of Computer Science and Engineering
    Sydney 2052, Australia


The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection

BibTeX Entry

    author           = {Peter Bradley and Anatoly B. Rosenfeld and K.K. Lee and D.N. Jamieson and Gernot Heiser and S. Satoh},
    journal          = {IEEE Transactions on Nuclear Science},
    title            = {Charge Collection and Radiation Hardness of a {SOI} Microdosimeter for Medical and Space
    volume           = {45},
    year             = {1998},
    pages            = {2700--2710}


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